Using the Spectrum Emission Mask Measurement
Use the Spectrum Emission Mask (SEM) measurement (also sometimes referred to as Conducted Spurious Emissions measurement) to identify and determine the power levels of spurious emissions outside the assigned CDMA channel. The measurement is made at the access network output port or at the repeater RF output port.
The SEM measurement only supports cdma2000, 1xEV-DO, and the W-CDMA UTRA channel standards, covering band classes 0,1,3,4,5,6, and 10. If you enable the SEM measurement using an unsupported channel standard, the limit mask will not be turned on and a message will be displayed telling you that the SEM Measurement does not support your selected channel standard. The table below summarizes supported and unsupported CDMA, 1xEV-DO and W-CDMA channel standards.
NOTE: 1xEVDO SEM measurements are made under two conditions. These are:
Continuous Data mode, that is, with no idle slots.
Idle mode, that is, with all slots idle except the control channel
NOTE: Your E7495A or E7495B test instrument can only make SEM measurements for the first condition, that is, in Continuous Data mode
To make an SEM measurement, the power level limits at different frequency offsets need to be specified. These power limits vary between different channel standards, but have all been predefined for you. These limits are listed in the two tables below. The first table shows the limits for CDMA and 1xEV-DO standards, and the second shows WCDMA UTRA standards.
For all possible channel standards for which you can make an SEM measurement (see the table above), the power limits have been predefined and will be displayed on the screen as a stepped yellow line. This line is known as the 'mask'. If you attempt to make an SEM measurement for a channel standard that does not support SEM measurements, no mask will be displayed, and the message, "SEM Measurement does not support the selected Channel Standard" will be displayed on the bottom of the test instrument's screen.